◆ Intellectual Property generation and evaluation

◆ Design review

◆ Fabrication evaluation

◆ Device behavioral characterization

    Static (Optical Microscopy (OM), SEM, FIB, Confocal, Interferometric)

    Dynamic (Interferometric, OM, integrated sensors)

    Electronic (capacitive, magnetic, integrated)

◆ Analysis

    Yield

    Performance

◆ Prototyping

    Complete with integrated electronics

◆ Automation

    LabVIEW and Matlab tools to automate test and analysis